Search for: [Description = "A measurement system for integrated circuit testing has been developed. It consists of a semi\-automatic probe station and a set of measurement equipment controlled by commercially available measurement software. The probe station is controlled by dedicated software. Both the measurement and station\-control software communicate using the DDE protocol. The measurement system is flexible. It is particularly suitable for semi\-automatic testing of multi\-project wafers. Output data generated by the system is used for the characterization of the CMOS technologies."]

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