Filters
  • Collections
  • Group objects
  • File type
  • Creator
  • Subject and Keywords
  • Date
  • Resource Type
  • Language

Search for: [Description = "The goal of this work was to study nitrogen implantation from plasma with the aim of applying it in dual gate oxide technology and to examine the influence of the rf power of plasma and that of oxidation type. The obtained structures were examined by means of ellipsometry, SIMS and electrical characterization methods."]

Number of results: 1

Items per page:

Jakubowski, Andrzej Beck, Romuald B. Ćwil, Michał Głuszko, Grzegorz Konarski, Piotr Bieniek, Tomasz

2007, nr 3
artykuł

This page uses 'cookies'. More information