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Search for: [Title = "DC and low\-frequency noise analysis for buried SiGe channel metamorphic PMOSFETs with high Ge content, Journal of Telecommunications and Information Technology, 2005, nr 1"]

Number of results: 1

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Parker, Evan H. C. Whall, Terence E. König, Ulf Känel, von Hans Hoeck, Georg Herzog, Hans-Joest Myronov, Maksym Durov, Sergiy Hackbarth, Thomas Mironov, Oleg A.

2005, nr 1
artykuł

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