@misc{Jakubowski_Andrzej_Characterization,
 author={Jakubowski, Andrzej and Tomaszewski, Daniel and Łukasiak, Lidia and Gibki, Jan and Ratajczak, Jacek and Kątcki, Jerzy},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Characterization of SOI fabrication process using gated-diode measurements and TEM studies, Journal of Telecommunications and Information Technology, 2000, nr 3,4},
 type={artykuł},
 keywords={characterization, microelectronics, SOI technology},
}