@misc{Fauzi_Ahmad_Hadinata_Detection,
 author={Fauzi, Ahmad Hadinata and Iskandar, D. N. F. Awang and Ganum, Adriana and Chin, Lim Phei},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy},
 language={ang},
 title={Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning, Journal of Telecommunications and Information Technology, 2022, nr 1},
 type={artykuł},
 keywords={machine learning, neural network, wafer imperfection identification, automated optical inspection},
}