@misc{Tsaturyan_Grigor_Test,
 author={Tsaturyan, Grigor and Gomtsyan, Hovhannes},
 howpublished={online},
 publisher={National Institute of Telecommunications},
 language={ang},
 title={Test Time Optimization Technique for IEEE 802.15.4z Ultra-Wideband Integrated Circuits, Journal of Telecommunications and Information Technology, 2024, nr 3},
 type={artykuł},
 keywords={interframe spacing, packet generation, RF circuit testing, sensitivity measurements, test time reduction, UWB},
}