@misc{Davey_William_M._Review,
 author={Davey, William M. and Lu, Yi and Mitrovic, Ivona Z. and Buiu, Octavian and Hall, Stephen},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Review and perspective of high-k dielectrics on silicon, Journal of Telecommunications and Information Technology, 2007, nr 2},
 type={artykuł},
 keywords={high-k dielectrics, aluminates, silicates, dielectric constant, hafnia, interfacial layer},
}