@misc{Grasby_Tim_J._Low,
 author={Grasby, Tim J. and Bacon, Adam R. and Parker, Evan H. C. and Fulgoni, Dominic J. F. and Leadley, David R. and Thomas, Stephen M. and Whall, Terence E. and Prest, Martin J.},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Low frequency noise in Si and Si/SiGe/Si PMOSFETs, Journal of Telecommunications and Information Technology, 2007, nr 2},
 type={artykuł},
 keywords={MOSFET, dynamic threshold mode, silicon germanium heterostructures, electronic noise},
}