@misc{Raskin_Jean-Pierre_On-wafer,
 author={Raskin, Jean-Pierre and Lederer, Dimitri},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={On-wafer wideband characterization: a powerful tool for improving the IC technologies, Journal of Telecommunications and Information Technology, 2007, nr 2},
 type={artykuł},
 keywords={MOSFET, small-signal equivalent circuit, extraction techniques, wideband characterization, silicon-on-insulator, microwave frequency},
}