@misc{Engström_Olof_Energy,
 author={Engström, Olof and Gutt, Tomasz and Przewłocki, Henryk M.},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Energy concepts involved in MOS characterization, Journal of Telecommunications and Information Technology, 2007, nr 2},
 type={artykuł},
 keywords={Meyer-Neldel rule, interface states, C-V technique, thermally stimulated current, MOS, capture cross sections},
}