@misc{Selberherr_Siegfried_Modeling,
 author={Selberherr, Siegfried and Grasser, Tibor},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Modeling of negative bias temperature instability, Journal of Telecommunications and Information Technology, 2007, nr 2},
 type={artykuł},
 keywords={simulation, interface states, negative bias temperature instability, defects, semiconductor device equations, reliability, negative bias temperature instability, modeling, simulation, hydrogen, silicon dioxide, defects, interface states, semiconductor device equations, modeling, hydrogen, silicon dioxide},
}