@misc{Tomaszewski_Daniel_Electrical,
 author={Tomaszewski, Daniel and Jaroszewicz, Bohdan and Pijanowska, Dorota G. and Grabiec, Piotr and Zaborowski, Michał and Yang, Chia-Ming},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Electrical characterization of ISFETs, Journal of Telecommunications and Information Technology, 2007, nr 3},
 type={artykuł},
 keywords={characterization, CMOS, I-V characteristics, ISFET, electrical measurements, parameters extraction},
}