@misc{Pleskacz_Witold_A._The,
 author={Pleskacz, Witold A. and Rakowski, Michał},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={The influence of yield model parameters on the probability of defect occurrence, Journal of Telecommunications and Information Technology, 2007, nr 3},
 type={artykuł},
 keywords={probability of defect occurrence, spot defect, critical area, yield model parameters},
}