@misc{Sikora_Andrzej_Application,
 author={Sikora, Andrzej and Gotszalk, Teodor and Rangelow, Ivo W. and Sankowska, Anna},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Application of scanning shear-force microscope for fabrication of nanostructures, Journal of Telecommunications and Information Technology, 2005, nr 1},
 type={artykuł},
 keywords={AFM, shear-force microscopy, nanostructures fabrication},
}