@misc{Raskin_Jean-Pierre_The,
 author={Raskin, Jean-Pierre and Vanhoenacker-Janvier, Danielle and Emam, Mostafa and Houri, Samer},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={The Impact of Externally Applied Mechanical Stress on Analog and RF Performances of SOI MOSFETs, Journal of Telecommunications and Information Technology, 2009, nr 4},
 type={artykuł},
 keywords={SOI MOSFET, mechanical stress, piezoresistance coefficient, intrinsic gain, cutoff frequency fT},
}