@misc{Yumisaki_Akihiro_Variation,
 author={Yumisaki, Akihiro and Sadachika, Norio and Mattausch, Hans Jurgen and Miura-Mattausch, Mitiko and Koide, Tetsushi and Johguchi, Koh and Kaya, Akihiro},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Variation Analysis of CMOS Technologies Using Surface-Potential MOSFET Model, Journal of Telecommunications and Information Technology, 2009, nr 4},
 type={artykuł},
 keywords={silicon, potential at channel surface, microscopic, macroscopic, within wafer, field-effect transistor, fabrication inaccuracy, compact model},
}