@misc{Jakubowski_Andrzej_Comparison,
 author={Jakubowski, Andrzej and Majkusiak, Bogdan and Korwin-Pawłowski, Michał and Janik, Tomasz},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Comparison of gate leakage current components in metal-insulator-semiconductor structures with high-k gate dielectrics, Journal of Telecommunications and Information Technology, 2001, nr 1},
 type={artykuł},
 keywords={high-k di-electrics, MIS structures, ultrathin dielectrics},
}