@misc{Mitrovic_Ivona_Z._Charging,
 author={Mitrovic, Ivona Z. and Hall, Stephen and Engström, Olof and Schmidt, Mathias and Piscator, Johan and Raeissi, Bahman and Gottlob, Heinrich D. B. and Hurley, Paul K. and Cherkaoui, Karim},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers, Journal of Telecommunications and Information Technology, 2010, nr 1},
 type={artykuł},
 keywords={defects, metal oxide semiconductor, dielectrics, high-k},
}