@misc{Chtourou_Radhouane_Spectroscopic,
 author={Chtourou, Radhouane and Rihani, Jaouher and Sedrine, Nebiha Ben and Harmand, Jean-Christophe},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 title={Spectroscopic Ellipsometry Analysis of Rapid Thermal Annealing Effecton MBE Grown GaAs1−x −Nx, Journal of Telecommunications and Information Technology, 2009, nr 1},
 type={artykuł},
 keywords={spectroscopic ellipsometry, semiconductors, rapid thermal annealing, optical constants, optoelectronic device, GaAs11−x −Nx},
}