@misc{Głuszko_Grzegorz_Characterization,
 author={Głuszko, Grzegorz and Łukasiak, Lidia and Gottlob, Heinrich and Lemme, Max and Szostak, Sławomir},
 howpublished={online},
 publisher={Instytut Łączności - Państwowy Instytut Badawczy, Warszawa},
 language={ang},
 type={artykuł},
 title={Characterization of SOI MOSFETs by means of charge-pumping, Journal of Telecommunications and Information Technology, 2007, nr 3},
 keywords={interface traps, electrical characterization, charge-pumping, SOI MOSFET},
}