Advanced search ?

Object

Download

Title: Investigation of barrier height distributions over the gate area of Al-SiO2-Si structures, Journal of Telecommunications and Information Technology, 2007, nr 3

Creator:

Przewłocki, Henryk M. ; Piskorski, Krzysztof

Date:

2007, nr 3

Resource Type:

artykuł

Description:

Distributions of the gate-dielectric EBG(x, y) and semiconductor-dielectric EBS(x, y) barrier height values have been determined using the photoelectric measurement method. Modified Powell-Berglund method was used to measure barrier height values. Modification of this method consisted in using a focused UV light beam of a small diameter d =0.3 mm. It was found that the EBG(x, y) distribution has a characteristic dome-like shape which corresponds with the independently determined shape of the effective contact potential difference fMS(x, y) distribution. On the other hand, the EBS(x, y) distribution is of a random character. It is shown that the EBG(x, y) distribution determines the shape of the fMS(x, y) distribution. The model of the EBG and EBS barrier height distributions over the gate area has been proposed.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Format:

application/pdf

Resource Identifier:

oai:bc.itl.waw.pl:286

DOI:

10.26636/jtit.2007.3.829

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności

Subject and keywords:

MOS system barrier height effective contact potential difference

Object collections:

Last modified:

Feb 25, 2026

In our library since:

Jan 27, 2010

Number of object content hits:

172

All available object's versions:

https://bc.itl.waw.pl/publication/329

Show description in RDF format:

RDF

Show description in OAI-PMH format:

OAI-PMH

Edition name Date
Piskorski, Krzysztof; Przewłocki, Henryk M., Investigation of barrier height distributions over the gate area of Al-SiO2-Si structures, Journal of Telecommunications and Information Technology, 2007, nr 3 Feb 25, 2026

Objects Similar
Comparison of the barrier height measurements by the Powell method with the ΦMS measurement results, Journal of Telecommunications and Information Technology, 2005, nr 1

Przewłocki, Henryk M. Rzodkiewicz, Witold Piskorski, Krzysztof Kudła, Andrzej

2005, nr 1
artykuł
LPT and SLPT Measurement Methods of Flat-Band Voltage (VFB) in MOS Devices, Journal of Telecommunications and Information Technology, 2009, nr 4

Przewłocki, Henryk M. Piskorski, Krzysztof

2009, nr 4
artykuł
Effects of stress annealing on the electrical and the optical properties of MOS devices, Journal of Telecommunications and Information Technology, 2005, nr 1

Przewłocki, Henryk M. Rzodkiewicz, Witold Kudła, Andrzej Sawicki, Zbigniew

2005, nr 1
artykuł
Energy concepts involved in MOS characterization, Journal of Telecommunications and Information Technology, 2007, nr 2

Engström, Olof Gutt, Tomasz Przewłocki, Henryk M.

2007, nr 2
artykuł
Variability of the local ΦMS values over the gate area of MOS devices, Journal of Telecommunications and Information Technology, 2005, nr 1

Przewłocki, Henryk M. Massoud, Hisham Z. Kudła, Andrzej Brzezińska, Danuta

2005, nr 1
artykuł
More
×

Citation

Citation style:

Contact details

Address

Instytut Łączności – Państwowy Instytut Badawczy ul. Szachowa 1 04-894 Warszawa

Phone

(+48) 5128 696

E-Mail

biblioteka@il-pib.pl

Visit us!

This page uses 'cookies'. More information