Title:

Semi-automatic test system for characterization of ASIC/MPWS, Journal of Telecommunications and Information Technology, 2005, nr 1

Creator:

Tomaszewski, Daniel ; Kociubiński, Andrzej ; Zając, Jerzy ; Wójcik, Janusz

Subject and Keywords:

automatic testing ; diagnostics of technology ; multi-project wafers

Description:

A measurement system for integrated circuit testing has been developed. It consists of a semi-automatic probe station and a set of measurement equipment controlled by commercially available measurement software. The probe station is controlled by dedicated software. Both the measurement and station-control software communicate using the DDE protocol. The measurement system is flexible. It is particularly suitable for semi-automatic testing of multi-project wafers. Output data generated by the system is used for the characterization of the CMOS technologies.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Date:

2005, nr 1

Resource Type:

artykuł

Format:

application/pdf

DOI:

10.26636/jtit.2005.1.280

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności