Title:

Analysis of errors in on-wafer measurements due to multimode propagation in CB-CPW, Journal of Telecommunications and Information Technology, 2005, nr 2

Creator:

Lewandowski, Arkadiusz ; Wiatr, Wojciech

Subject and Keywords:

calibration ; monolithic microwave integrated circuit (MMIC) ; error analysis ; on-wafer probe ; numerical electromagnetic analysis ; multimode propagation ; conductor-backed coplanar waveguide (CB-CPW) ; de-embedding ; on-wafer measurements ; microstrip-like mode

Description:

We study for the first time errors in on-wafer scattering parameter measurements caused by the parasitic microstrip-like mode propagation in conductor-backed coplanar waveguide (CB-CPW). We determine upper bound for these errors for typical CPW devices such as a matched load, an open circuit, and a transmission line section. To this end, we develop an electromagnetic-simulations-based multimode three-port model for the transition between an air-coplanar probe and the CB-CPW. Subsequently, we apply this model to examine errors in the device S parameters de-embedded from measurements affected by the parasitic MSL mode. Our analysis demonstrates that the multimode propagation in CB-CPW may significantly deteriorate the S-parameters measured on wafer.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Date:

2005, nr 2

Resource Type:

artykuł

Format:

application/pdf

DOI:

10.26636/jtit.2005.2.313

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności