Limiti, Ernesto ; Giannini, Franko ; Saggio, Giovanni ; Acciari, Gianluca
Subject and Keywords:noise ; device characterisation ; lowering uncertainty ; measurement errors
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: Resource Identifier:ISSN 1509-4553, on-line: ISSN 1899-8852
DOI: ISSN: eISSN: Source:Journal of Telecommunications and Information Technology
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