Title:

Lowering the uncertainty in fast noise measurement procedures, Journal of Telecommunications and Information Technology, 2002, nr 1

Creator:

Limiti, Ernesto ; Giannini, Franko ; Saggio, Giovanni ; Acciari, Gianluca

Subject and Keywords:

noise ; device characterisation ; lowering uncertainty ; measurement errors

Description:

To completely characterise the noise behaviour of a two port device, four noise parameters Fmin; Rn; Gopt ; and Bopt must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 mmd -doped HEMT devices by Alenia, demonstrating as the common hot-cold measurement procedure can result with an error confidence as low as 0.2% for all the noise parameters.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Date:

2002, nr 1

Resource Type:

artykuł

Format:

application/pdf

Resource Identifier:

ISSN 1509-4553, on-line: ISSN 1899-8852

DOI:

10.26636/jtit.2002.1.98

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności