Tomaszewski, Daniel ; Jaroszewicz, Bohdan ; Pijanowska, Dorota G. ; Grabiec, Piotr ; Zaborowski, Michał ; Yang, Chia-Ming
Subject and Keywords:characterization ; CMOS ; I-V characteristics ; ISFET ; electrical measurements ; parameters extraction
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: Resource Identifier:ISSN 1509-4553, on-line: ISSN 1899-8852
Source:Journal of Telecommunications and Information Technology
Language: Rights Management: