Iniewski, Krzysztof ; Voinigescu, Sorin P. ; Syrzycki, Marek
Subject and Keywords:SiGe ; CMOS ; cut-o frequency ; WAN ; SAN ; LAN ; InP ; MAN ; networking ; OEO conversion ; manufacturability
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: DOI: ISSN: eISSN: Source:Journal of Telecommunications and Information Technology
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