Schwierz, Frank ; Liou, Juin J.
Subject and Keywords:HBT ; RF CMOS ; microwave devices ; heterostructures ; HEMT ; RF devices ; frequency limits
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: DOI: ISSN: eISSN: Source:Journal of Telecommunications and Information Technology
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