Title:

Precise measurement of complex permittivity of materials for telecommunications devices, Journal of Telecommunications and Information Technology, 2001, nr 3

Creator:

Nakamura, Takayuki ; Nikawa, Yoshio

Subject and Keywords:

microwave measurement ; simulation model ; cavity resonator ; temperature dependence of complex permittivity ; perturbation method ; TLM method

Description:

In order to obtain precise complex permittivity of the dielectric materials obtained from the perturbation method a correction curve is made using the electromagnetic field simulator which applies transmission line modeling (TLM) method. In this experiment, generated microwave power with the frequency of 2.45 GHz is applied to heat dielectric material while measuring temperature dependence of complex permittivity of dielectric material. To obtain these objectives cavity resonator with cooling system is designed. It is found from the result that the accurate temperature dependence of complex permittivity of the materials can be obtained by the method presented here.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Date:

2001, nr 3

Resource Type:

artykuł

Format:

application/pdf

Resource Identifier:

ISSN 1509-4553, on-line: ISSN 1899-8852

DOI:

10.26636/jtit.2001.3.65

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności