Engström, Olof ; Gutt, Tomasz ; Przewłocki, Henryk M.
Subject and Keywords:Meyer-Neldel rule ; interface states ; C-V technique ; thermally stimulated current ; MOS ; capture cross sections
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: Resource Identifier:ISSN 1509-4553, on-line: ISSN 1899-8852
Source:Journal of Telecommunications and Information Technology
Language: Rights Management: