Engström, Olof ; Gutt, Tomasz ; Przewłocki, Henryk M.
Subject and Keywords:Meyer-Neldel rule ; interface states ; C-V technique ; thermally stimulated current ; MOS ; capture cross sections
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: DOI: ISSN: eISSN: Source:Journal of Telecommunications and Information Technology
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