Pleskacz, Witold A. ; Rakowski, Michał
Subject and Keywords:probability of defect occurrence ; spot defect ; critical area ; yield model parameters
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: Resource Identifier:ISSN 1509-4553, on-line: ISSN 1899-8852
Source:Journal of Telecommunications and Information Technology
Language: Rights Management: