Raskin, Jean-Pierre ; Lederer, Dimitri
Subject and Keywords:MOSFET ; small-signal equivalent circuit ; extraction techniques ; wideband characterization ; silicon-on-insulator ; microwave frequency
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: DOI: ISSN: eISSN: Source:Journal of Telecommunications and Information Technology
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