Yoshitomi, Sadayuki ; Kokatsu, Hideyuki ; Kojima, Kenji ; Kimijima, Hideki
Subject and Keywords:CMOS VCO ; electro-magnetic simulation ; EKV2.6-MOS model ; circuit test structure ; SPICE ; RF CMOS ; spiral inductor
Description: Publisher:Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Date: Resource Type: Format: DOI: ISSN: eISSN: Source:Journal of Telecommunications and Information Technology
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