Title:

Application of scanning shear-force microscope for fabrication of nanostructures, Journal of Telecommunications and Information Technology, 2005, nr 1

Creator:

Sikora, Andrzej ; Gotszalk, Teodor ; Rangelow, Ivo W. ; Sankowska, Anna

Subject and Keywords:

AFM ; shear-force microscopy ; nanostructures fabrication

Description:

In view of the rapid growth of interest in AFM technique in surface property investigation and local surface modification we describe here an AFM microscope with optical tip oscillation detection. The modular shear-force/tunneling microscope for surface topography measurement and nanoanodisation is described. The measurement instrument presented here is based on the fiber Fabry-Perot interferometer for the measurement of the conductive microtip oscillation that is used as nano e-beam for local surface anodisation. An advantage of this system is that quatitative measurements of tip vibration amplitude are easily performed.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Date:

2005, nr 1

Resource Type:

artykuł

Format:

application/pdf

DOI:

10.26636/jtit.2005.1.288

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności