Tytuł:

A versatile tool for extraction of MOSFETs parameters, Journal of Telecommunications and Information Technology, 2005, nr 1

Autor:

Tomaszewski, Daniel ; Grabiec, Piotr ; Marczewski, Jacek ; Domański, Krzysztof ; Kucharski, Krzysztof ; Kociubiński, Andrzej

Temat i słowa kluczowe:

SPICE ; MOSFETs parameters ; least squares method

Opis:

Extraction of MOSFET parameters is a very important task for the purposes of MOS integrated circuits characterization and design. A versatile tool for the MOSFET parameter extraction has been developed in the Institute of Electron Technology (IET). It is used to monitor the technologies applied for fabrication of several groups of devices, e.g., CMOS ASICs, SOI pixel detectors. At present two SPICE MOSFET models (LEVEL = 1, 2) have been implemented in the extraction tool. The LEVEL = 3 model is currently being implemented. The tool combines different methods of parameter extraction based on local as well as global fitting of models to experimental data.

Wydawca:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Data wydania:

2005, nr 1

Typ zasobu:

artykuł

Format:

application/pdf

DOI:

10.26636/jtit.2005.1.279

ISSN:

1509-4553

eISSN:

1899-8852

Źródło:

Journal of Telecommunications and Information Technology

Język:

ang

Prawa:

Biblioteka Naukowa Instytutu Łączności