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Title: Reliability and low-frequency noise measurements of InGaAsP MQW buried-heterostructure lasers, Journal of Telecommunications and Information Technology, 2003, nr 1

Creator:

Letal, Gregory ; Šermukšnis, Emilis ; Matukas, Jonas ; Pralgauskaite, Sandra ; Smetona, Saulius ; Mallard, Robert ; Palenskis, Vilius ; Vyšniauskas, Juozas

Date:

2003, nr 1

Resource Type:

artykuł

Description:

A laser diode reliability test based on the measurements of the low-frequency optical and electrical noise, and their correlation factor changes during short-time ageing is presented. The noise characteristics reveal obvious differences between the stable and unreliable lasers operated near the threshold region. An excessive Lorentzian type noise with negative correlation factor at the threshold could be one of the criteria for identifying unreliable lasers. The behavior of unreliable lasers during ageing could be explained by migration of point recombination centres at the interface of an active layer, and by the formation of defect clusters.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Format:

application/pdf

Resource Identifier:

oai:bc.itl.waw.pl:566 ; ISSN 1509-4553, on-line: ISSN 1899-8852

DOI:

10.26636/jtit.2003.1.158

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności

Subject and keywords:

low-frequency noise reliability correlation factor laser diode electrical noise optical noise

Object collections:

Last modified:

Feb 25, 2026

In our library since:

Mar 16, 2010

Number of object content hits:

271

All available object's versions:

https://bc.itl.waw.pl/publication/632

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Edition name Date
Pralgauskaite, Sandra; Matukas, Jonas; Palenskis, Vilius; Letal, Gregory, Reliability and low-frequency noise measurements of InGaAsP MQW buried-heterostructure lasers, Journal of Telecommunications and Information Technology, 2003, nr 1 Feb 25, 2026

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Instytut Łączności – Państwowy Instytut Badawczy ul. Szachowa 1 04-894 Warszawa

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(+48) 5128 696

E-Mail

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