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Title: An impact of frequency on capacitances of partially-depleted SOI MOSFETs, Journal of Telecommunications and Information Technology, 2000, nr 3,4

Creator:

Jakubowski, Andrzej ; Tomaszewski, Daniel ; Łukasiak, Lidia ; Zaręba, Agnieszka

Date:

2000, nr 3,4

Resource Type:

artykuł

Description:

A non-quasi-static model of partially-depleted SOI MOSFETs is presented. Phenomena, which are particularly responsible for dependence of device admittances on frequency are briefly described. Several C-V characteristics of the SOI MOSFET calculated for a wide range of frequencies, preliminary results of numerical analysis and of measurements and brief analysis of the results are presented. Methods of model improvement are proposed.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Format:

application/pdf

Resource Identifier:

oai:bc.itl.waw.pl:1643 ; ISSN 1509-4553, on-line: ISSN 1899-8852

DOI:

10.26636/jtit.2000.3-4.26

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności

Subject and keywords:

SOI MOSFET small-signal models non-quasistaticanalysis admittances

Object collections:

Last modified:

May 16, 2024

In our library since:

May 22, 2014

Number of object content hits:

104

All available object's versions:

https://bc.itl.waw.pl/publication/1845

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Edition name Date
Tomaszewski, Daniel; Łukasiak, Lidia; Zaręba, Agnieszka; Jakubowski, Andrzej, An impact of frequency on capacitances of partially-depleted SOI MOSFETs, Journal of Telecommunications and Information Technology, 2000, nr 3,4 May 16, 2024

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Instytut Łączności – Państwowy Instytut Badawczy ul. Szachowa 1 04-894 Warszawa

Phone

(+48) 5128 696

E-Mail

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