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Title: Comparison of the barrier height measurements by the Powell method with the ΦMS measurement results, Journal of Telecommunications and Information Technology, 2005, nr 1

Creator:

Przewłocki, Henryk M. ; Rzodkiewicz, Witold ; Piskorski, Krzysztof ; Kudła, Andrzej

Date:

2005, nr 1

Resource Type:

artykuł

Description:

n this work, we have compared the barrier height measurements carried out using the Powell method with the photoelectric effective contact potential difference (&phiMS) measurement results. The photoelectric measurements were performed on the samples that were previously applied in the investigation of the influence of stress on the duration of annealing in nitrogen. This paper shows that the results of barrier height measurement using the Powell method differ significantly from the &phi(MS) measurement results.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Format:

application/pdf

Resource Identifier:

oai:bc.itl.waw.pl:375

DOI:

10.26636/jtit.2005.1.281

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności

Subject and keywords:

MOS system barrier height effective contact potential difference

Object collections:

Last modified:

Jun 12, 2024

In our library since:

Mar 1, 2010

Number of object content hits:

208

All available object's versions:

https://bc.itl.waw.pl/publication/425

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Edition name Date
Piskorski, Krzysztof; Kudła, Andrzej; Rzodkiewicz, Witold; Przewłocki, Henryk M., Comparison of the barrier height measurements by the Powell method with the ΦMS measurement results, Journal of Telecommunications and Information Technology, 2005, nr 1 Jun 12, 2024

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Instytut Łączności – Państwowy Instytut Badawczy ul. Szachowa 1 04-894 Warszawa

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E-Mail

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