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Title: A versatile tool for extraction of MOSFETs parameters, Journal of Telecommunications and Information Technology, 2005, nr 1

Creator:

Tomaszewski, Daniel ; Grabiec, Piotr ; Marczewski, Jacek ; Domański, Krzysztof ; Kucharski, Krzysztof ; Kociubiński, Andrzej

Date:

2005, nr 1

Resource Type:

artykuł

Description:

Extraction of MOSFET parameters is a very important task for the purposes of MOS integrated circuits characterization and design. A versatile tool for the MOSFET parameter extraction has been developed in the Institute of Electron Technology (IET). It is used to monitor the technologies applied for fabrication of several groups of devices, e.g., CMOS ASICs, SOI pixel detectors. At present two SPICE MOSFET models (LEVEL = 1, 2) have been implemented in the extraction tool. The LEVEL = 3 model is currently being implemented. The tool combines different methods of parameter extraction based on local as well as global fitting of models to experimental data.

Publisher:

Instytut Łączności - Państwowy Instytut Badawczy, Warszawa

Format:

application/pdf

Resource Identifier:

oai:bc.itl.waw.pl:377

DOI:

10.26636/jtit.2005.1.279

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

Rights Management:

Biblioteka Naukowa Instytutu Łączności

Subject and keywords:

SPICE MOSFETs parameters least squares method

Object collections:

Last modified:

Jun 12, 2024

In our library since:

Mar 1, 2010

Number of object content hits:

819

All available object's versions:

https://bc.itl.waw.pl/publication/427

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Edition name Date
Tomaszewski, Daniel; Kociubiński, Andrzej; Marczewski, Jacek; Kucharski, Krzysztof; Domański, Krzysztof; Grabiec, Piotr, A versatile tool for extraction of MOSFETs parameters, Journal of Telecommunications and Information Technology, 2005, nr 1 Jun 12, 2024

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