Instytut Łączności – Państwowy Instytut Badawczy contains 2 325 digital objects
Object
Title: The Impact of Externally Applied Mechanical Stress on Analog and RF Performances of SOI MOSFETs, Journal of Telecommunications and Information Technology, 2009, nr 4
Creator:
Raskin, Jean-Pierre ; Vanhoenacker-Janvier, Danielle ; Emam, Mostafa ; Houri, Samer
Date:
Resource Type:
Description:
Publisher:
Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Format:
Resource Identifier:
oai:bc.itl.waw.pl:469 ; ISSN 1509-4553, on-line: ISSN 1899-8852
DOI:
ISSN:
eISSN:
Source:
Journal of Telecommunications and Information Technology
Language:
Rights Management:
Biblioteka Naukowa Instytutu Łączności
Object collections:
- Digital Library
- Digital Library > Institute's Publications
- Digital Library > Institute's Publications > Current Publications > Journal of Telecommunications and Information Technology (JTIT)
- Digital Library > Institute's Publications > Archives > Przegląd Prac Instytutu Łączności
Last modified:
Feb 25, 2026
In our library since:
Mar 8, 2010
Number of object content hits:
254
All available object's versions:
https://bc.itl.waw.pl/publication/527
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